Frequency dependent Noise Figure Analysis of Continuous Photonic Time stretch System

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Acknowledgements

We are grateful to S. Bielawski at Universite des Sciences et Technologies de Lille, France for invaluable discussions on electron-beam diagnostics. We are also thankful to D. Solli at UCLA for helpful comments. The work at UCLA was partially supported by the Office of Naval Research (ONR) Multidisciplinary University Research Initiatives (MURI) on Optical Computing and by NantWorks, LLC.

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Correspondence to Bahram Jalali.

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Competing interests

B.J. is a co-founder of Time Photonics, the manufacturer of RogueScope, a single-shot spectrometer based on the time-stretch technique.

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Mahjoubfar, A., Churkin, D., Barland, S. et al. Time stretch and its applications. Nature Photon 11, 341–351 (2017). https://doi.org/10.1038/nphoton.2017.76

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